Deep Learning for Manufacturing Inspection Applications

Wednesday, May 22, 2:45 PM - 3:15 PM
Summit Track: 
Room 203/204

Recently, deep learning has revolutionized artificial intelligence and has been shown to provide the best solutions to many problems in computer vision, image classification, speech recognition and natural language processing.

We will present our deep learning activities for machine vision applications such as manufacturing inspection, defect detection and classification. Deep learning has gained significant attention in the machine vision industry because it does not require the complex algorithm development used by traditional rule-based image processing techniques.

We will cover the deep learning workflow from data collection to training and deployment, as well as the process of transfer learning. We will present two case studies where we apply transfer learning to manufacturing inspection applications.


Stephen Se

Research Manager, FLIR Systems

Stephen Se is the Research Manager at FLIR Integrated Imaging Solutions, with over 20 years of experience in computer vision, video/image processing, deep learning, 3D modeling, mobile robotics, airborne surveillance, etc. He completed a B.Eng. degree in Computing at Imperial College London and a Ph.D. degree in Computer Vision and Robotics at University of Oxford. He then worked as a post-doctoral researcher at University of British Columbia on vision-based mobile robot localization. Subsequently, he led computer vision R&D projects for defense, mining and terrestrial applications at MDA Corporation. He is a senior member of IEEE and a professional engineer, with over 40 technical publications.

See you at the Summit! May 20-23 in Santa Clara, California!
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