Bookmark and Share

"Deep Learning for Manufacturing Inspection Applications," a Presentation from FLIR Systems

Register or sign in to access the Embedded Vision Academy's free technical training content.

The training materials provided by the Embedded Vision Academy are offered free of charge to everyone. All we ask in return is that you register, and tell us a little about yourself so that we can understand a bit about our audience. As detailed in our Privacy Policy, we will not share your registration information, nor contact you, except with your consent.

Registration is free and takes less than one minute. Click here to register, and get full access to the Embedded Vision Academy's unique technical training content.

If you've already registered, click here to sign in.

See a sample of this page's content below:

Stephen Se, Research Manager at FLIR Systems, presents the "Deep Learning for Manufacturing Inspection Applications" tutorial at the May 2019 Embedded Vision Summit.

Recently, deep learning has revolutionized artificial intelligence and has been shown to provide the best solutions to many problems in computer vision, image classification, speech recognition and natural language processing. Se presents his company's deep learning activities for machine vision applications such as manufacturing inspection, defect detection and classification.

Deep learning has gained significant attention in the machine vision industry because it does not require the complex algorithm development used by traditional rule-based image processing techniques. Se cover the deep learning workflow from data collection to training and deployment, as well as the process of transfer learning. He presents two case studies where his company applies transfer learning to manufacturing inspection applications.